Enrique Rosendo

According to our database, Enrique Rosendo authored at least 3 papers between 2008 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2020

Porous Silicon Gas Sensors: The Role of the Layer Thickness and the Silicon Conductivity.

Francisco Ramírez-González, Godofredo García Salgado, Enrique Rosendo, Tomás Díaz, Fabiola Nieto-Caballero, Antonio Coyopol, Román Romano, Alberto Luna, Karim Monfil, Erick Gastellou

Sensors, 2020

2008

Fabrication, characterization, and analysis of photodetectors metal-porous silicon with different geometry and thickness of the porous silicon layer.

Godofredo García Salgado, R. Hernández, Javier Martínez, Tomás Díaz, Héctor Juárez, Enrique Rosendo, Reina Galeazzi, A. García, Gabriel Juárez

Microelectron. J., 2008

Low temperature SnO₂ films deposited by APCVD.

Crisóforo Morales, Héctor Juárez, Tomás Díaz, Yasuhiro Matsumoto, Enrique Rosendo, Godofredo Garcia, M. Rubin, F. Mora, Mauricio Pacio, A. García

Microelectron. J., 2008