Etienne Okada

According to our database, Etienne Okada authored at least 8 papers between 2014 and 2025.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2025

Effect of High Temperature RF Stress on the Trapping Behavior of Carbon Doped AlN/GaN/AlGaN HEMTs.

Lyes Ben Hammou, François Grandpierron, Elodie Carneiro, Katir Ziouche, Etienne Okada, Farid Medjdoub, Gilles Patriarche

Proceedings of the IEEE International Reliability Physics Symposium, 2025

2022

Temperature compensated power detector towards power consumption optimization in 5G devices.

Issa Alaji, Etienne Okada, Daniel Gloria, Guillaume Ducournau, Christophe Gaquière

Microelectron. J., 2022

2021

Plasmonic Layer as a Localized Temperature Control Element for Surface Plasmonic Resonance-Based Sensors.

Sivaramakrishnan Ganesan, Sophie Maricot, Jean-François Robillard, Etienne Okada, Mohamed-Taieb Bakouche, Laurent Hay, Jean-Pierre Vilcot

Sensors, 2021

Design of zero bias power detectors towards power consumption optimization in 5G devices.

Issa Alaji, Walid Aouimeur, Haitham Ghanem, Etienne Okada, Sylvie Lépilliet, Daniel Gloria, Guillaume Ducournau, Christophe Gaquière

Microelectron. J., 2021

2020

Large-area femtosecond laser milling of silicon employing trench analysis.

Arun Bhaskar, Justine Philippe, Flavie Braud, Etienne Okada, Vanessa Avramovic, Jean-François Robillard, Cédric Durand, Daniel Gloria, Christophe Gaquière, Emmanuel Dubois

CoRR, 2020

Short-term reliability of high performance Q-band AlN/GaN HEMTs.

Riad Kabouche, Kathia Harrouche, Etienne Okada, Farid Medjdoub

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2017

Importance of buffer configuration in GaN HEMTs for high microwave performance and robustness.

R. Pecheux, R. Kabouche, E. Dogmus, A. Linge, Etienne Okada, M. Zegaoui, Farid Medjdoub

Proceedings of the 47th European Solid-State Device Research Conference, 2017

2014

High performance high reliability AlN/GaN DHFET.

Farid Medjdoub, Etienne Okada, Bertrand Grimbert, Damien Ducatteau, Riccardo Silvestri, Matteo Meneghini, Enrico Zanoni, Gaudenzio Meneghesso

Proceedings of the 44th European Solid State Device Research Conference, 2014