F. Alagi

According to our database, F. Alagi authored at least 4 papers between 2002 and 2011.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2011

Hot-carrier-induced time dependent dielectric breakdown in high voltage pMOSFETs.

F. Alagi

Microelectron. Reliab., 2011

A first-order kinetics ageing model for the hot-carrier stress of high-voltage MOSFETs.

F. Alagi

Microelectron. Reliab., 2011

2010

DMOS FET parameter drift kinetics from microscopic modeling.

F. Alagi

Microelectron. Reliab., 2010

2002

True constant temperature MTF test system for the characterization of electromigration of thick Cu interconnection lines.

Graziella Scandurra, Carmine Ciofi, Calogero Pace, F. Speroni, F. Alagi

Microelectron. Reliab., 2002