Feibo Du

According to our database, Feibo Du authored at least 2 papers between 2022 and 2026.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2026

A compact SCR structure with reduced trigger voltage and parasitic capacitance for high-speed I/O ESD protection.

Longhua Lin, Shupeng Chen, Ruibo Chen, Zhengwei Zhang, Hongxia Liu, Feibo Du, Zhiwei Liu

Microelectron. J., 2026

2022

Nanoscale Analysis of Breakdown Induced Crack Propagation in DTSCR Devices.

Xinqian Chen, Fei Hou, Zuoyuan Dong, Yuxin Zhang, Chaolun Wang, Fang Liang, Feibo Du, Zhiwei Liu, Xing Wu

Proceedings of the IEEE International Reliability Physics Symposium, 2022