Franco Fiori

According to our database, Franco Fiori authored at least 22 papers between 2001 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

On the Damping of Ringing Affecting Power Transistors by Means of Active Gate Drivers.

Erica Raviola, Franco Fiori

IEEE Trans. Circuits Syst. I Regul. Pap., April, 2024

2023

A Baseband Wireless VNA for the Characterization of Multiport Distributed Systems.

Markeljan Fishta, Erica Raviola, Franco Fiori

IEEE Trans. Instrum. Meas., 2023

From Radio to In-Pipe Acoustic Communication for Smart Water Networks in Urban Environments: Design Challenges and Future Trends.

Markeljan Fishta, Erica Raviola, Franco Fiori

Inf., 2023

2022

A Wireless Communication System for Urban Water Supply Networks Based on Guided Acoustic Waves.

Markeljan Fishta, Erica Raviola, Franco Fiori

IEEE Access, 2022

Experimental Characterization of In-Pipe Acoustic Communication Channels Through Measurement of Pressure Transfer Functions.

Markeljan Fishta, Erica Raviola, Franco Fiori, Francesco Calza, Arturo Tornaboni

Proceedings of the 27th IEEE International Conference on Emerging Technologies and Factory Automation, 2022

2021

Decimation of Delta-Sigma-Modulated Signals Using a Low-Cost Microcontroller.

Markeljan Fishta, Franco Fiori

Circuits Syst. Signal Process., 2021

2020

Testing Heatsink Faults in Power Transistors by means of Thermal Model.

Davide Piumatti, Matteo Vincenzo Quitadamo, Matteo Sonza Reorda, Franco Fiori

Proceedings of the IEEE Latin-American Test Symposium, 2020

2018

A Test Structure for the EMC Characterization of Small Integrated Circuits.

Michele Perotti, Franco Fiori

IEEE Trans. Instrum. Meas., 2018

Real Time Defect Detection of Wheel Bearing by Means of a Wirelessly Connected Microphone.

Erica Raviola, Franco Fiori

Proceedings of the 14th Conference on Ph.D. Research in Microelectronics and Electronics, 2018

2015

Susceptibility to EMI of high side current sensors based on chopper OpAmps.

Philipp Schröter, Fabio Ballarin, Franco Fiori

Proceedings of the 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, 2015

Smart power IC macromodeling for DPI analysis.

H. Herrmann, W. Horchler, S. Schwarz, Philipp Schröter, Frank Klotz, Marco Brignone, Franco Fiori

Proceedings of the 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, 2015

2013

A New Mirroring Circuit for Power MOS Current Sensing Highly Immune to EMI.

Orazio Aiello, Franco Fiori

Sensors, 2013

A new MagFET-based integrated current sensor highly immune to EMI.

Orazio Aiello, Franco Fiori

Microelectron. Reliab., 2013

2012

A New Front-End for Binary Data Recovery in EM Polluted Environment.

Calogero Bona, Franco Fiori

IEEE Trans. Circuits Syst. I Regul. Pap., 2012

On the use of high-impedance power supplies to reduce the substrate switching noise in system-on-chips.

Franco Fiori

Microelectron. Reliab., 2012

2011

Electrical Model of Microcontrollers for the Prediction of Electromagnetic Emissions.

Yamarita Villavicencio, Francesco Musolino, Franco Fiori

IEEE Trans. Very Large Scale Integr. Syst., 2011

MOS power transistor model for Electromagnetic Susceptibility analysis.

Calogero Bona, Franco Fiori

Microelectron. Reliab., 2011

2010

A Simulation-Based Black-Box Microcontroller Model for EME Prediction.

Yamarita Villavicencio, Francesco Musolino, Franco Fiori

IEICE Trans. Commun., 2010

2007

Low-power single-ended I/O circuit for binary interchip communications.

Franco Fiori

Proceedings of the 18th European Conference on Circuit Theory and Design, 2007

2003

Comparison of IC conducted emission measurement methods.

Franco Fiori, Francesco Musolino

IEEE Trans. Instrum. Meas., 2003

2001

Analysis of EME produced by a microcontroller operation.

Franco Fiori, Francesco Musolino

Proceedings of the Conference on Design, Automation and Test in Europe, 2001

Susceptibility of analog cells to substrate interference.

Franco Fiori

Proceedings of the Conference on Design, Automation and Test in Europe, 2001