Fuchen Mu

According to our database, Fuchen Mu authored at least 3 papers between 2001 and 2002.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2002

Weibull characteristics of n-MOSFET's with ultrathin gate oxides under FN stress and lifetime prediction.

Fuchen Mu, Mingzhen Xu, Changhua Tan, Xiaorong Duan

Microelectron. Reliab., 2002

2001

A new lifetime prediction method for hot-carrier degradation in n-MOSFETs with ultrathin gate oxides under V_g=V_d.

Fuchen Mu, Mingzhen Xu, Changhua Tan, Xiaorong Duan

Microelectron. Reliab., 2001

Proportional difference estimate method of determining characteristic parameters of normal and log-normal distributions.

Fuchen Mu, Changhua Tan, Mingzhen Xu

Microelectron. Reliab., 2001