G.-J. Kim

According to our database, G.-J. Kim authored at least 2 papers between 2022 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2025

A Critical Investigation of Hot Carrier Degradation in Low VTNMOSFETs in DRAM.

N. Choudhury, S. Lee, D. Son, G. Yang, G.-J. Kim, N.-H. Lee, Y. C. Hwang, SB. Ko, S. Pae

Proceedings of the IEEE International Reliability Physics Symposium, 2025

2022

Transistor Reliability Characterization for Advanced DRAM with HK+MG & EUV process technology.

Nam-Hyun Lee, Sunhang Lee, S.-H. Kim, G.-J. Kim, K. W. Lee, Y. S. Lee, Y. C. Hwang, H. S. Kim, S. Pae

Proceedings of the IEEE International Reliability Physics Symposium, 2022