Geetani Edirisooriya

According to our database, Geetani Edirisooriya authored at least 14 papers between 1991 and 1996.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

1996

Closed Form Aliasing Probability For Q-ary Symmetric Errors.

Geetani Edirisooriya

VLSI Design, 1996

1995

Authors' reply to comments on "Aliasing Properties of Circular MISRs".

Geetani Edirisooriya, John P. Robinson

J. Electron. Test., 1995

Diagnosis of scan path failures.

Samantha Edirisooriya, Geetani Edirisooriya

Proceedings of the 13th IEEE VLSI Test Symposium (VTS'95), April 30, 1995

Scan Chain Fault Diagnosis with Fault Dictionaries.

Geetani Edirisooriya, Samantha Edirisooriya

Proceedings of the 1995 IEEE International Symposium on Circuits and Systems, ISCAS 1995, Seattle, Washington, USA, April 30, 1995

1993

Test generation to minimize error masking.

Geetani Edirisooriya, John P. Robinson

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1993

Aliasing properties of circular MISRs.

Geetani Edirisooriya, John P. Robinson

J. Electron. Test., 1993

Time and space correlated errors in signature analysis.

Geetani Edirisooriya, Samantha Edirisooriya, John P. Robinson

Proceedings of the 11th IEEE VLSI Test Symposium (VTS'93), 1993

A new built-in self-test method based on prestored testing.

Geetani Edirisooriya, Samantha Edirisooriya, John P. Robinson

Proceedings of the 11th IEEE VLSI Test Symposium (VTS'93), 1993

On the Performance of Augmented Signature Testing.

Geetani Edirisooriya, Samantha Edirisooriya, John P. Robinson

Proceedings of the 1993 IEEE International Symposium on Circuits and Systems, 1993

1992

Design of low cost ROM based test generators.

Geetani Edirisooriya, John P. Robinson

Proceedings of the 10th IEEE VLSI Test Symposium (VTS'92), 1992

Aliasing in Multiple-Valued Test Data Compaction.

Geetani Edirisooriya, John P. Robinson

Proceedings of the 22nd IEEE International Symposium on Multiple-Valued Logic, 1992

A signature efficient solution for remote file comparison.

Samantha Edirisooriya, Geetani Edirisooriya

Proceedings of the Sixteenth Annual International Computer Software and Applications Conference, 1992

1991

Cyclic code weight spectra and BIST aliasing.

Geetani Edirisooriya, John P. Robinson

J. Electron. Test., 1991

Aliasing Probability in Multiple Input Linear Signature Automata for Q-ary Symmetric Errors.

Geetani Edirisooriya, John P. Robinson

Proceedings of the Proceedings 1991 IEEE International Conference on Computer Design: VLSI in Computer & Processors, 1991