Gerard A. Allan

According to our database, Gerard A. Allan authored at least 12 papers between 1992 and 2000.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2000

Yield prediction by sampling IC layout.

Gerard A. Allan

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2000

IC Critical Volume Calculation through Ray-Casting of CSG Trees.

Mike Moran, Gerard A. Allan

Proceedings of the 15th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2000), 2000

1999

Efficient extra material critical area algorithms.

Gerard A. Allan, Anthony J. Walton

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1999

1998

A Comparison of Efficient Dot Throwing and Shape Shifting Extra Material Critical Area Estimation.

Gerard A. Allan

Proceedings of the 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '98), 1998

1997

Efficient critical area estimation for arbitrary defect shapes.

Gerard A. Allan, Anthony J. Walton

Proceedings of the 1997 Workshop on Defect and Fault-Tolerance in VLSI Systems (DFT '97), 1997

1996

Integration of DFM Techniques and Design Automation.

Thomas G. Waring, Gerard A. Allan, Anthony J. Walton

Proceedings of the 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 1996

Application of a Survey Sampling Critical Area Computation Tool in a Manufacturing Environment.

Frederic Duvivier, Gerard A. Allan

Proceedings of the 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 1996

Yield Prediction by Sampling with the EYES Tool.

Gerard A. Allan, Anthony J. Walton

Proceedings of the 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 1996

1995

Critical area extraction of extra material soft faults.

Gerard A. Allan, Anthony J. Walton

Proceedings of the 1995 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 1995

Hierarchical critical area extraction with the EYE tool.

Gerard A. Allan, Anthony J. Walton

Proceedings of the 1995 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 1995

1994

Efficient Critical Area Algorithms and Their Application to Yield Improvement and Test Strategies.

Gerard A. Allan, Anthony J. Walton

Proceedings of the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, 1994

1992

A yield improvement technique for IC layout using local design rules.

Gerard A. Allan, Anthony J. Walton, Robert J. Holwill

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1992