Giorgio Vannini

Orcid: 0000-0002-9533-9693

According to our database1, Giorgio Vannini authored at least 9 papers between 1990 and 2022.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

2022
Analysis of Efficiency-Limiting Factors Resulting from Transistor Current Source on Class-F and Inverse Class-F Power Amplifiers.
IEICE Trans. Electron., October, 2022

2018
Analysis of Gate-Voltage Clipping Behavior on Class-F and Inverse Class-F Amplifiers.
Proceedings of the 2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2018

2017
Impact of transistor model uncertainty on microwave load-pull simulations.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2017

2011
Analysis of the gate current as a suitable indicator for FET degradation under nonlinear dynamic regime.
Microelectron. Reliab., 2011

A dual-source nonlinear measurement system oriented to the empirical characterization of low-frequency dispersion in microwave electron devices.
Comput. Stand. Interfaces, 2011

2009
An Automated Measurement System for the Characterization of Electron Device Degradation Under Nonlinear Dynamic Regime.
IEEE Trans. Instrum. Meas., 2009

2005
A new technique for thermal resistance measurement in power electron devices.
IEEE Trans. Instrum. Meas., 2005

2002
Power amplifier ACPR simulation using standard harmonic balance tools.
Proceedings of the 2002 International Symposium on Circuits and Systems, 2002

1990
Mathematical approaches to electron device modelling for non-linear microwave circuit design: State of the art and present trends.
Eur. Trans. Telecommun., 1990


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