Roberto Menozzi

According to our database, Roberto Menozzi authored at least 25 papers between 1990 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

Electrical Vehicle Fleet Management for Industrial Environment with Battery SoH Prediction Through Neural Networks.

Paolo Cova, Nicola Delmonte, Stefano Ferrari, Massimo Lazzaroni, Roberto Menozzi, Danilo Santoro, Marco Simonazzi

Proceedings of the IEEE International Conference on Metrology for eXtended Reality, 2023

2021

Modeling of a university campus Micro-Grid for optimal planning of renewable generation and storage deployment.

Marco Simonazzi, Nicola Delmonte, Paolo Cova, Gianluigi Ferrari, Francesco Zanichelli, Roberto Menozzi

Proceedings of the IEEE International Smart Cities Conference, 2021

2013

Temperature-dependent reverse-bias stress of normally-off GaN power FETs.

Francesco Giuliani, Nicola Delmonte, Paolo Cova, Roberto Menozzi

Microelectron. Reliab., 2013

2011

Analysis of the gate current as a suitable indicator for FET degradation under nonlinear dynamic regime.

Antonio Raffo, Sergio Di Falco, Giovanna Sozzi, Roberto Menozzi, Dominique M. M.-P. Schreurs, Giorgio Vannini

Microelectron. Reliab., 2011

A physical large-signal model for GaN HEMTS including self-heating and trap-related dispersion.

D. Mari, Mirko Bernardoni, Giovanna Sozzi, Roberto Menozzi, G. A. Umana-Membreno, Brett D. Nener

Microelectron. Reliab., 2011

Dynamic electro-thermal modeling for power device assemblies.

Paolo Cova, Mirko Bernardoni, Nicola Delmonte, Roberto Menozzi

Microelectron. Reliab., 2011

2010

Thermal modeling of planar transformer for switching power converters.

Mirko Bernardoni, Nicola Delmonte, Paolo Cova, Roberto Menozzi

Microelectron. Reliab., 2010

2009

Three-dimensional finite-element thermal simulation of GaN-based HEMTs.

Fulvio Bertoluzza, Nicola Delmonte, Roberto Menozzi

Microelectron. Reliab., 2009

Heat management for power converters in sealed enclosures: A numerical study.

Mirko Bernardoni, Paolo Cova, Nicola Delmonte, Roberto Menozzi

Microelectron. Reliab., 2009

2008

Thermal modeling of high frequency DC-DC switching modules: Electromagnetic and thermal simulation of magnetic components.

Paolo Cova, Nicola Delmonte, Roberto Menozzi

Microelectron. Reliab., 2008

System-on-chip microwave radiometer for thermal remote sensing and its application to the forest fire detection.

Federico Alimenti, Domenico Zito, Andrea Boni, Mattia Borgarino, Alessandro Fonte, Alessandro Carboni, Salvatore Leone, Marco Pifferi, Luca Roselli, Bruno Neri, Roberto Menozzi

Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, 2008

2007

A review of the use of electro-thermal simulations for the analysis of heterostructure FETs.

Giovanna Sozzi, Roberto Menozzi

Microelectron. Reliab., 2007

Test structures for dielectric spectroscopy of thin films at microwave frequencies.

Nicola Delmonte, B. E. Watts, Giovanni Chiorboli, Paolo Cova, Roberto Menozzi

Microelectron. Reliab., 2007

2006

Editorial.

Peter Ersland, Roberto Menozzi

Microelectron. Reliab., 2006

Thermal characterization and modeling of power hybrid converters for distributed power systems.

Paolo Cova, Nicola Delmonte, Roberto Menozzi

Microelectron. Reliab., 2006

Experimental and numerical study of the recovery softness and overvoltage dependence on p-i-n diode design.

Paolo Cova, Roberto Menozzi, Marco Portesine

Microelectron. J., 2006

2005

On state breakdown in PHEMTs and its temperature dependence.

Paolo Cova, Nicola Delmonte, Roberto Menozzi

Microelectron. Reliab., 2005

2004

Temperature-dependent breakdown and hot carrier stress of PHEMTs.

Paolo Cova, Nicola Delmonte, Giovanna Sozzi, Roberto Menozzi

Microelectron. Reliab., 2004

2003

Power p-i-n diodes for snubberless application: H⁺ irradiation for soft and reliable reverse recovery.

Paolo Cova, Roberto Menozzi, Marco Portesine

Microelectron. Reliab., 2003

Editorial.

Wallace T. Anderson, Roberto Menozzi

Microelectron. Reliab., 2003

2002

High-electric-field effects and degradation of AlGaAs/GaAs power HFETs: a numerical study.

Giovanna Sozzi, Roberto Menozzi

Microelectron. Reliab., 2002

High-field step-stress and long term stability of PHEMTs with different gate and recess lengths.

Paolo Cova, Roberto Menozzi, Maximilian Dammann, T. Feltgen, W. Jantz

Microelectron. Reliab., 2002

2001

Reliability physics of compound semiconductor transistors for microwave applications.

Mattia Borgarino, Roberto Menozzi, Domenico Dieci, Laura Cattani, Fausto Fantini

Microelectron. Reliab., 2001

1990

Testing of E²PROM aging and endurance: A case study.

Massimo Lanzoni, Roberto Menozzi, Piero Olivo, Bruno Riccò, Andrea Haardt

Eur. Trans. Telecommun., 1990

An improved procedure to test CMOS ICs for latch-up.

Roberto Menozzi, Massimo Lanzoni, Luca Selmi, Bruno Riccò

Proceedings of the Proceedings IEEE International Test Conference 1990, 1990