Giovanni Chiorboli

Orcid: 0000-0001-7399-1827

According to our database1, Giovanni Chiorboli authored at least 16 papers between 1994 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2023
An Improved Method Based on Support Vector Regression With Application Independent Training for State of Charge Estimation.
IEEE Trans. Instrum. Meas., 2023

2022
An Innovative Architecture of Full-Digital Microphone Arrays Over A²B Network for Consumer Electronics.
IEEE Trans. Consumer Electron., 2022

2021
Transducer Arrays Over A²B Networks in Industrial and Automotive Applications: Clock Propagation Measurements.
IEEE Access, 2021

An accurate and stable bed-based ballistocardiogram measurement and analysis system.
Proceedings of the IEEE International Workshop on Metrology for Industry 4.0 & IoT, 2021

2010
A CMOS vector lock-in amplifier for sensor applications.
Microelectron. J., 2010

2009
Single-Reference Foreground Calibration of High-Resolution, High-Speed Pipeline ADCs.
Circuits Syst. Signal Process., 2009

2007
Test structures for dielectric spectroscopy of thin films at microwave frequencies.
Microelectron. Reliab., 2007

2005
DAC calibration by weighting capacitor rotation in a pipelined ADC.
Proceedings of the Third IASTED International Conference on Circuits, 2005

2003
Uncertainty of mean value and variance obtained from quantized data.
IEEE Trans. Instrum. Meas., 2003

2002
Sub-picosecond aperture-uncertainty measurements [ADCs].
IEEE Trans. Instrum. Meas., 2002

2001
ADC sinewave histogram testing with quasi-coherent sampling.
IEEE Trans. Instrum. Meas., 2001

1999
Cross-correlation noise measurements in A/D converters.
IEEE Trans. Instrum. Meas., 1999

1998
A new method for estimating the aperture uncertainty of A/D converters.
IEEE Trans. Instrum. Meas., 1998

Some thoughts on the word error rate measurement of A/D converters.
Proceedings of the 5th IEEE International Conference on Electronics, Circuits and Systems, 1998

1995
Short test procedures for R-2R D/A converters by electrical modeling and application of the ambiguity algorithm.
J. Electron. Test., 1995

1994
Physical Modeling of Linearity Errors for the Diagnosis of High Resolution R-2R D/A Converters.
Proceedings of the EDAC - The European Conference on Design Automation, ETC - European Test Conference, EUROASIC - The European Event in ASIC Design, Proceedings, February 28, 1994


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