H. D. Yen

According to our database, H. D. Yen authored at least 1 paper in 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2012

RF stress effects on CMOS LC-loaded VCO reliability evaluated by experiments.

H. D. Yen, Jiann-Shiun Yuan, Ruey-Lue Wang, G. W. Huang, W. K. Yeh, F. S. Huang

Microelectron. Reliab., 2012