Hajime Sano
Orcid: 0009-0007-1741-9456
According to our database1,
Hajime Sano authored at least 2 papers
between 2024 and 2026.
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Bibliography
2026
IEEE Des. Test, February, 2026
2024
Overcome the End of Life of 3D Flash Memory by Recovery Annealing, Aiming for Carbon Neutrality in Semiconductor Manufacturing.
Proceedings of the IEEE International Memory Workshop, 2024