Hironobu Niijima

According to our database, Hironobu Niijima authored at least 4 papers between 1988 and 1996.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

1996

Scan Design Oriented Test Technique for VLSI's Using ATE.

Yasuji Oyama, Toshinobu Kanai, Hironobu Niijima

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

1993

CAD-Driven High-Precision E-Beam Positioning.

Kent Kwang, Hsin Wang, Arthur Hu, Mitsuyuki Asaki, Hironobu Niijima

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

1990

New approach to integrate LSI design databases with e-beam tester.

Arthur Hu, Hironobu Niijima

Proceedings of the Proceedings IEEE International Test Conference 1990, 1990

1988

Electron Beam Tester Integrated into a VLSI Tester.

Hironobu Niijima, Yasuo Tokunaga, Shouichi Koshizuka, Kazuo Yakuwa, Péter Fazekas, Mathias Sturm, Hans-Peter Feuerbaum

Proceedings of the Proceedings International Test Conference 1988, 1988