I. H. Joo

According to our database1, I. H. Joo authored at least 1 paper in 2013.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of four.

Timeline

Legend:

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Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

2013
Hot hole-induced device degradation by drain junction reverse current.
Microelectron. Reliab., 2013


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