J. L. Rainard

According to our database, J. L. Rainard authored at least 4 papers between 1987 and 1994.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

1994

Hierarchical Test Analysis of VLSI Circuits for Random BIST.

G. Masseboeuf, J. Pulou, J. L. Rainard

Proceedings of the Dependable Computing, 1994

1991

Implementing Boundary-Scan and Pseudo-Random BIST in an Asynchronous Transfer Mode Switch.

P. Thorel, J. L. Rainard, Alain Botta, Alain Chemarin, Jacques Majos

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991

1990

Some relationships between delay testing and stuck-open testing in CMOS circuits.

Rene David, S. Rahal, J. L. Rainard

Proceedings of the European Design Automation Conference, 1990

1987

Fault Detection By Consumption Measurement in CMOS Circuits.

Mireille Jacomino, J. L. Rainard, Rene David

Proceedings of the Fehlertolerierende Rechensysteme / Fault-Tolerant Computing Systems, 1987