J. Najm

According to our database, J. Najm authored at least 1 paper in 1995.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

1995

Cyclic stress tests for full scan circuits.

Vinay Dabholkar, Sreejit Chakravarty, J. Najm, Janak H. Patel

Proceedings of the 13th IEEE VLSI Test Symposium (VTS'95), April 30, 1995