J. S. Liu

According to our database, J. S. Liu authored at least 1 paper in 2008.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of six.

2008

Reliability evaluation of BOAC and normal pad stacked-chip packaging using low-K wafers.

K. M. Chen, K. H. Tang, J. S. Liu

Microelectron. Reliab., 2008