Jack C. Lee

According to our database, Jack C. Lee authored at least 15 papers between 1982 and 2021.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2021

Embedded emerging memory technologies for neuromorphic computing: temperature instability and reliability.

Yao-Feng Chang, Ilya Karpov, Reed Hopkins, David Janosky, Jacob Medeiros, Benjamin Sherrill, Jiahan Zhang, Yifu Huang, Tanmoy Pramanik, Albert B. Chen, Tony Acosta, Abdullah Guler, James A. O'Donnell, Pedro A. Quintero, Nathan Strutt, Oleg Golonzka, Chris Connor, Jack C. Lee, Jeffrey Hicks

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020

Complementary Metal-Oxide Semiconductor and Memristive Hardware for Neuromorphic Computing.

Mostafa Rahimi Azghadi, Ying-Chen Chen, Jason Kamran Eshraghian, Jia Chen, Chih-Yang Lin, Amirali Amirsoleimani, Adnan Mehonic, Anthony J. Kenyon, Burt Fowler, Jack C. Lee, Yao-Feng Chang

Adv. Intell. Syst., 2020

Understanding of Multiple Resistance States by Current-sweep Measurement and Compliance Current Modulation in 2D MoS2-based Non-volatile Resistance Switching Devices.

Xiaohan Wu, Ruijing Ge, Deji Akinwande, Jack C. Lee

Proceedings of the 2020 Device Research Conference, 2020

2019

Resistive Switching Early Failure and Gap Identification in Bilayer Selectorless RRAM Applications.

Ying-Chen Chen, Szu-Tung Hu, Chao-Cheng Lin, Jack C. Lee

Proceedings of the Device Research Conference, 2019

2018

Nonlinearity Enhancement by Positive Pulse Stress in Multilevel Cell Selectorless RRAM Applications.

Ying-Chen Chen, Xiaohan Wu, Yao-Feng Chang, Jack C. Lee

Proceedings of the 76th Device Research Conference, 2018

2007

Robust mixture modeling using the skew <i>t</i> distribution.

Tsung-I Lin, Jack C. Lee, Wan J. Hsieh

Stat. Comput., 2007

2006

Hf-Based High-k Dielectrics: Process Development, Performance Characterization, and Reliability

Young-Hee Kim, Jack C. Lee

Synthesis Lectures on Solid State Materials and Devices, Morgan & Claypool Publishers, ISBN: 978-3-031-02552-5, 2006

On fast supervised learning for normal mixture models with missing information.

Tsung-I Lin, Jack C. Lee, Hsiu J. Ho

Pattern Recognit., 2006

2005

Threshold voltage instability characteristics of HfO₂ dielectrics n-MOSFETs.

Se Jong Rhee, Jack C. Lee

Microelectron. Reliab., 2005

2004

Bayesian analysis of mixture modelling using the multivariate t distribution.

Tsung-I Lin, Jack C. Lee, Huey F. Ni

Stat. Comput., 2004

Reliability characteristics of high-k dielectrics.

Young-Hee Kim, Jack C. Lee

Microelectron. Reliab., 2004

2001

Populating the Hermitage Museum's new web site.

Fred Mintzer, Gordon W. Braudaway, Francis P. Giordano, Jack C. Lee, Karen A. Magerlein, Silvana D'Auria, Amnon Ribak, Gil Shapir, Fabio Schiattarella, John Tolva, Andrey Zelenkov

Commun. ACM, 2001

1996

Toward on-line, worldwide access to Vatican Library materials.

Frederick C. Mintzer, Leonard E. Boyle, Albert N. Cazes, Brian S. Christian, Steven C. Cox, Francis P. Giordano, Henry M. Gladney, Jack C. Lee, Milton L. Kelmanson, Antonio C. Lirani, Karen A. Magerlein, Ana M. B. Pavani, Fabio Schiattarella

IBM J. Res. Dev., 1996

1982

A VLSI Design Verification Strategy.

Arnold S. Tran, Richard A. Forsberg, Jack C. Lee

IBM J. Res. Dev., 1982

5 Classification of growth curves.

Jack C. Lee

Proceedings of the Classification, Pattern Recognition and Reduction of Dimensionality, 1982