Jacques Taillefer

According to our database1, Jacques Taillefer authored at least 1 paper in 2003.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Links

On csauthors.net:

Bibliography

2003
IEEE 1149.1 Based Defect and Fault Tolerant Scan Chain for Wafer Scale Integration.
Proceedings of the 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 2003


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