Jaewoong Shim

Orcid: 0000-0001-8279-7137

According to our database1, Jaewoong Shim authored at least 7 papers between 2017 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

2023
Learning from single-defect wafer maps to classify mixed-defect wafer maps.
Expert Syst. Appl., December, 2023

2022
Domain-adaptive active learning for cost-effective virtual metrology modeling.
Comput. Ind., 2022

2021
Active cluster annotation for wafer map pattern classification in semiconductor manufacturing.
Expert Syst. Appl., 2021

Adaptive fault detection framework for recipe transition in semiconductor manufacturing.
Comput. Ind. Eng., 2021

2020
Kernel Rotation Forests for Classification.
Proceedings of the 2020 IEEE International Conference on Big Data and Smart Computing, 2020

2018
Product failure prediction with missing data.
Int. J. Prod. Res., 2018

2017
Mining the relationship between production and customer service data for failure analysis of industrial products.
Comput. Ind. Eng., 2017


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