Jaidev Shenoy
According to our database1,
Jaidev Shenoy authored at least 2 papers
between 2019 and 2025.
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Bibliography
2025
Test Data Compaction Techniques with Improved Diagnostic Capabilities and Reduced Tester Time.
Proceedings of the IEEE International Test Conference, 2025
2019
Proceedings of the 32nd International Conference on VLSI Design and 18th International Conference on Embedded Systems, 2019