Jef Vanlaer

According to our database, Jef Vanlaer authored at least 6 papers between 2012 and 2014.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2014

The RAYMOND simulation package - Generating RAYpresentative MONitoring Data to design advanced process monitoring and control algorithms.

Geert Gins, Jef Vanlaer, Pieter Van den Kerkhof, Jan F. M. Van Impe

Comput. Chem. Eng., 2014

2013

Quality assessment of a variance estimator for Partial Least Squares prediction of batch-end quality.

Jef Vanlaer, Geert Gins, Jan F. M. Van Impe

Comput. Chem. Eng., 2013

Extending Statistical Models for Batch-End Quality Prediction to Batch Control.

Geert Gins, Jef Vanlaer, Pieter Van den Kerkhof, Jan F. M. Van Impe

Proceedings of the Advances in Data Mining. Applications and Theoretical Aspects, 2013

Contribution plots for Statistical Process Control: Analysis of the smearing-out effect.

Pieter Van den Kerkhof, Jef Vanlaer, Geert Gins, Jan F. M. Van Impe

Proceedings of the 12th European Control Conference, 2013

2012

Dynamic model-based fault diagnosis for (bio)chemical batch processes.

Pieter Van den Kerkhof, Geert Gins, Jef Vanlaer, Jan F. M. Van Impe

Comput. Chem. Eng., 2012

The Influence of Input and Output Measurement Noise on Batch-End Quality Prediction with Partial Least Squares.

Jef Vanlaer, Pieter Van den Kerkhof, Geert Gins, Jan F. M. Van Impe

Proceedings of the Advances in Data Mining. Applications and Theoretical Aspects, 2012