Jeff Gambino

According to our database1, Jeff Gambino authored at least 4 papers between 2009 and 2019.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2019
BEOL Process Development Using Fast Power Cycling on Test Structures.
Proceedings of the IEEE International Reliability Physics Symposium, 2019

Reliability of an Al2O3/SiO2MIM Capacitor for 180nm (3.3V) Technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018
Device reliability for CMOS image sensors with backside through-silicon vias.
Proceedings of the IEEE International Reliability Physics Symposium, 2018

2009
Copper interconnect technology for the 32 nm node and beyond.
Proceedings of the IEEE Custom Integrated Circuits Conference, 2009


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