Jingshuai Bian

According to our database, Jingshuai Bian authored at least 1 paper in 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2020

基于卷积去噪自编码器的芯片表面弱缺陷检测方法 (Detection Method of Chip Surface Weak Defect Based on Convolution Denoising Auto-encoders).

Yuetong Luo, Jingshuai Bian, Meng Zhang, Yongming Rao, Feng Yan

计算机科学, 2020