Joel T. Yuen

According to our database1, Joel T. Yuen authored at least 4 papers between 1992 and 1994.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

1994
Automated synthesis of pseudo-exhaustive test generator in VLSI BIST design.
IEEE Trans. Very Large Scale Integr. Syst., 1994

1993
Logic partitioning to pseudo-exhaustive test for BIST design.
Proceedings of the 1993 IEEE/ACM International Conference on Computer-Aided Design, 1993

1992
Autonomous-Tol for Hardware Partitioning in a Built-in Self-Test Environment.
Proceedings of the Proceedings 1992 IEEE International Conference on Computer Design: VLSI in Computer & Processors, 1992

Concurrent Test Scheduling in Built-In Self-Test Environment.
Proceedings of the Proceedings 1992 IEEE International Conference on Computer Design: VLSI in Computer & Processors, 1992


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