John Mallon

According to our database, John Mallon authored at least 11 papers between 2004 and 2011.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2011

Capturing Optimal Image Networks for Planar Camera Calibration.

Brendan P. Byrne, John Mallon, Paul F. Whelan

Proceedings of the 2011 Irish Machine Vision and Image Processing Conference, 2011

2010

Efficient generic calibration method for general cameras with single centre of projection.

Aubrey K. Dunne, John Mallon, Paul F. Whelan

Comput. Vis. Image Underst., 2010

2009

Efficient Planar Camera Calibration Via Automatic Image Selection.

Brendan P. Byrne, John Mallon, Paul F. Whelan

Proceedings of the VISAPP 2009 - Proceedings of the Fourth International Conference on Computer Vision Theory and Applications, Lisboa, Portugal, February 5-8, 2009, 2009

2008

Removing Pose from Face Images.

Seán Begley, John Mallon, Paul F. Whelan

Proceedings of the Advances in Visual Computing, 4th International Symposium, 2008

2007

Which pattern? Biasing aspects of planar calibration patterns and detection methods.

John Mallon, Paul F. Whelan

Pattern Recognit. Lett., 2007

Calibration and removal of lateral chromatic aberration in images.

John Mallon, Paul F. Whelan

Pattern Recognit. Lett., 2007

Pose estimation for objects with planar surfaces using eigenimage and range data analysis.

Ovidiu Ghita, Paul F. Whelan, David Vernon, John Mallon

Mach. Vis. Appl., 2007

A Comparison of New Generic Camera Calibration with the Standard Parametric Approach.

Aubrey K. Dunne, John Mallon, Paul F. Whelan

Proceedings of the IAPR Conference on Machine Vision Applications (IAPR MVA 2007), 2007

2005

Computational approach for depth from defocus.

Ovidiu Ghita, Paul F. Whelan, John Mallon

J. Electronic Imaging, 2005

Projective rectification from the fundamental matrix.

John Mallon, Paul F. Whelan

Image Vis. Comput., 2005

2004

Precise Radial Un-Distortion of Images.

John Mallon, Paul F. Whelan

Proceedings of the 17th International Conference on Pattern Recognition, 2004