John S. Suehle

According to our database1, John S. Suehle authored at least 3 papers between 2002 and 2005.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2005
Detailed study and projection of hard breakdown evolution in ultra-thin gate oxides.
Microelectron. Reliab., 2005

Reverse short channel effects in high-k gated nMOSFETs.
Microelectron. Reliab., 2005

2002
Ultra-thin Gate Oxide Reliability and Implications for Design (Tutorial Abstract).
Proceedings of the 3rd International Symposium on Quality of Electronic Design, 2002


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