Jon Barth

According to our database1, Jon Barth authored at least 4 papers between 2001 and 2002.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2002
Charged device model metrology: limitations and problems.
Microelectron. Reliab., 2002

Correlation considerations: Real HBM to TLP and HBM testers.
Microelectron. Reliab., 2002

2001
The importance of standardizing CDM ESD test head parameters to obtain data correlation.
Microelectron. Reliab., 2001

Issues concerning charged device model ESD verification modules - the need to move to alumina.
Microelectron. Reliab., 2001


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