Tom Diep

According to our database, Tom Diep authored at least 3 papers between 2001 and 2002.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2002

Charged device model metrology: limitations and problems.

Leo G. Henry, Jon Barth, Hugh Hyatt, Tom Diep, Michael Stevens

Microelectron. Reliab., 2002

2001

The importance of standardizing CDM ESD test head parameters to obtain data correlation.

Leo G. Henry, Mark A. Kelly, Tom Diep, Jon Barth

Microelectron. Reliab., 2001

Issues concerning charged device model ESD verification modules - the need to move to alumina.

Leo G. Henry, Mark A. Kelly, Tom Diep, Jon Barth

Microelectron. Reliab., 2001