Jongin Shim

According to our database, Jongin Shim authored at least 7 papers between 2001 and 2004.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of four.

2004

Analytical models and algorithms for the efficient signal integrity verification of inductance-effect-prominent multicoupled VLSI circuit interconnects.

Seongkyun Shin, Yungseon Eo, William R. Eisenstadt, Jongin Shim

IEEE Trans. Very Large Scale Integr. Syst., 2004

A decoupling technique for efficient timing analysis of VLSI interconnects with dynamic circuit switching.

Yungseon Eo, Seongkyun Shin, William R. Eisenstadt, Jongin Shim

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2004

Analytical Dynamic Time Delay Model of Strongly Coupled RLC Interconnect Lines Dependent on Switching.

Seongkyun Shin, Yungseon Eo, William R. Eisenstadt, Jongin Shim

Proceedings of the 5th International Symposium on Quality of Electronic Design (ISQED 2004), 2004

2002

Generalized traveling-wave-based waveform approximation technique for the efficient signal integrity verification of multicoupled transmission line system.

Yungseon Eo, Seongkyun Shin, William R. Eisenstadt, Jongin Shim

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2002

A traveling-wave-based waveform approximation technique for thetiming verification of single transmission lines.

Yungseon Eo, Jongin Shim, William R. Eisenstadt

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2002

Analytical signal integrity verification models for inductance-dominant multi-coupled VLSI interconnects.

Seongkyun Shin, Yungseon Eo, William R. Eisenstadt, Jongin Shim

Proceedings of the Fourth IEEE/ACM International Workshop on System-Level Interconnect Prediction (SLIP 2002), 2002

2001

Fast and accurate quasi-three-dimensional capacitance determination of multilayer VLSI interconnects.

Woojin Jin, Yungseon Eo, William R. Eisenstadt, Jongin Shim

IEEE Trans. Very Large Scale Integr. Syst., 2001