Josef Sikula

According to our database, Josef Sikula authored at least 5 papers between 2001 and 2008.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2008

Electro-ultrasonic spectroscopy of polymer-based thick film layers.

Vlasta Sedlakova, Josef Sikula, Pavel Tofel, Jiri Majzner

Microelectron. Reliab., 2008

2002

Failure modes of tantalum capacitors made by different technologies.

Petr Vasina, T. Zednicek, Josef Sikula, Jan Pavelka

Microelectron. Reliab., 2002

Noise and transport characterisation of tantalum capacitors.

Jan Pavelka, Josef Sikula, Petr Vasina, Vlasta Sedlakova, Munecazu Tacano, Sumihisa Hashiguchi

Microelectron. Reliab., 2002

2001

Transport and noise properties of CdTe(Cl) crystals.

P. Schauer, Josef Sikula, Pavel Moravec

Microelectron. Reliab., 2001

Low-frequency noise of thick-film resistors as quality and reliability indicator.

Dubravka Rocak, Darko Belavic, Marko Hrovat, Josef Sikula, Pavel Koktavy, Jan Pavelka, Vlasta Sedlakova

Microelectron. Reliab., 2001