Julien Goxe

Affiliations:
  • Freescale Semiconducteurs France, Toulouse, France


According to our database1, Julien Goxe authored at least 4 papers between 2013 and 2015.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
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Links

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Bibliography

2015
Latent gate oxide defects case studies.
Microelectron. Reliab., 2015

Failure analysis on recovering low resistive via in mixed-mode device.
Microelectron. Reliab., 2015

2013
Detectability of automotive power MOSFET on-resistance failure at high current induced by Wafer Fab process excursion.
Microelectron. Reliab., 2013

Benefits of field failure distribution modeling to the failure analysis.
Microelectron. Reliab., 2013


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