Jun Zhao

According to our database, Jun Zhao authored at least 12 papers between 1998 and 2004.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2004

Sequential diagnosis of processor array systems.

Jun Zhao, Fred J. Meyer, Nohpill Park, Fabrizio Lombardi

IEEE Trans. Reliab., 2004

2003

Maximal diagnosis of interconnects of random access memories.

Jun Zhao, Fred J. Meyer, Fabrizio Lombardi, Nohpill Park

IEEE Trans. Reliab., 2003

2002

Analyzing and Diagnosing Interconnect Faults in Bus-Structured Systems.

Jun Zhao, Fred J. Meyer, Fabrizio Lombardi

IEEE Des. Test Comput., 2002

2000

Testing SRAM-Based Content Addressable Memories.

Jun Zhao, V. Swamy Irrinki, Mukesh Puri, Fabrizio Lombardi

IEEE Trans. Computers, 2000

Detection of Inter-Port Faults in Multi-Port Static RAMs.

Jun Zhao, V. Swamy Irrinki, Mukesh Puri, Fabrizio Lombardi

Proceedings of the 18th IEEE VLSI Test Symposium (VTS 2000), 30 April, 2000

Diagnosing the Interconnect of Bus-Connected Multi-RAM Systems under Restricted and General Fault Models.

Jun Zhao, Fred J. Meyer, Fabrizio Lombardi

Proceedings of the 8th IEEE International Workshop on Memory Technology, 2000

1999

Reconfiguring one-time programmable FPGAs.

Xiao-Tao Chen, Wenyi Feng, Jun Zhao, Fred J. Meyer, Fabrizio Lombardi

IEEE Micro, 1999

Adaptive Fault Detection and Diagnosis of RAM Interconnects.

Jun Zhao, Fred J. Meyer, Fabrizio Lombardi

J. Electron. Test., 1999

Maximal Diagnosis of Interconnects of Random Access Memories.

Jun Zhao, Fred J. Meyer, Fabrizio Lombardi

Proceedings of the 17th IEEE VLSI Test Symposium (VTS '99), 1999

Interconnect Diagnosis of Bus-Connected Multi-RAM Systems.

Jun Zhao, Fred J. Meyer, Fabrizio Lombardi

Proceedings of the 7th IEEE International Workshop on Memory Technology, 1999

Good Processor Identification in Two-Dimensional Grids.

Fred J. Meyer, Fabrizio Lombardi, Jun Zhao

Proceedings of the 14th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '99), 1999

1998

Fault Detection and Diagnosis of Interconnects of Random Access Memories.

Jun Zhao, Fred J. Meyer, Fabrizio Lombardi

Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998