Fred J. Meyer

According to our database, Fred J. Meyer authored at least 55 papers between 1988 and 2006.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2006

Measuring the timing jitter of ATE in the frequency domain.

Luca Schiano, Mariam Momenzadeh, Fengming Zhang, Young-Jun Lee, Thomas Kane, Solomon Max, Philip Perkins, Yong-Bin Kim, Fabrizio Lombardi, Fred J. Meyer

IEEE Trans. Instrum. Meas., 2006

Evaluating the Yield of Repairable SRAMs for ATE.

Marco Ottavi, Luca Schiano, Xiaopeng Wang, Yong-Bin Kim, Fred J. Meyer, Fabrizio Lombardi

IEEE Trans. Instrum. Meas., 2006

2005

Analysis and evaluation of multisite testing for VLSI.

Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi

IEEE Trans. Instrum. Meas., 2005

QCA-Based Majority Gate Design under Radius of Effect-Induced Faults.

Zachary D. Patitz, Nohpill Park, Minsu Choi, Fred J. Meyer

Proceedings of the 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 2005

2004

Sequential diagnosis of processor array systems.

Jun Zhao, Fred J. Meyer, Nohpill Park, Fabrizio Lombardi

IEEE Trans. Reliab., 2004

Analysis and measurement of fault coverage in a combined ATE and BIST environment.

Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi

IEEE Trans. Instrum. Meas., 2004

Guest editorial.

Cristiana Bolchini, Fred J. Meyer

J. Syst. Archit., 2004

Simulation of reconfigurable memory core yield.

Marco Ottavi, Xiaopeng Wang, Fred J. Meyer, Fabrizio Lombardi

Proceedings of the 14th ACM Great Lakes Symposium on VLSI 2004, 2004

On The Yield of Compiler-Based eSRAMs.

Xiaopeng Wang, Marco Ottavi, Fred J. Meyer, Fabrizio Lombardi

Proceedings of the 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 2004

Reliability Modeling and Assurance of Clockless Wave Pipeline.

Tao Feng, Nohpill Park, Yong-Bin Kim, Fabrizio Lombardi, Fred J. Meyer

Proceedings of the 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 2004

2003

Maximal diagnosis of interconnects of random access memories.

Jun Zhao, Fred J. Meyer, Fabrizio Lombardi, Nohpill Park

IEEE Trans. Reliab., 2003

Analysis and measurement of timing jitter induced by radiated EMI noise in automatic test equipment.

Young-Jun Lee, Thomas Kane, Jong-Jin Lim, Young Jun Schiano, Yong-Bin Kim, Fred J. Meyer, Fabrizio Lombardi, Solomon Max

IEEE Trans. Instrum. Meas., 2003

Predicting Defect-Tolerant Yield in the Embedded Core Context.

Fred J. Meyer, Nohpill Park

IEEE Trans. Computers, 2003

Adaptive Algorithms for Maximal Diagnosis of Wiring Interconnects.

Wenyi Feng, Fred J. Meyer, Fabrizio Lombardi

IEEE Trans. Computers, 2003

Hybrid Multisite Testing at Manufacturing.

Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi, Farzin Karimi

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment.

Fengming Zhang, Young-Jun Lee, Thomas Kane, Luca Schiano, Mariam Momenzadeh, Yong-Bin Kim, Fred J. Meyer, Fabrizio Lombardi, Solomon Max, Phil Perkinson

Proceedings of the 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 2003

2002

Quality-effective repair of multichip module systems.

Nohpill Park, Fred J. Meyer, Fabrizio Lombardi

J. Syst. Archit., 2002

Analyzing and Diagnosing Interconnect Faults in Bus-Structured Systems.

Jun Zhao, Fred J. Meyer, Fabrizio Lombardi

IEEE Des. Test Comput., 2002

Random Testing of Multi-Port Static Random Access Memories.

Farzin Karimi, Fred J. Meyer, Fabrizio Lombardi

Proceedings of the 10th IEEE International Workshop on Memory Technology, 2002

Test Time Reduction in a Manufacturing Environment by Combining BIST and ATE.

Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi

Proceedings of the 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 2002

2001

Connectivity-Based Multichip Module Repair.

Minsu Choi, Nohpill Park, Fred J. Meyer, Fabrizio Lombardi

Proceedings of the 8th Pacific Rim International Symposium on Dependable Computing (PRDC 2001), 2001

Novel Approaches for Fault Detection in Two-Dimensional Combinational Arrays.

Xiao-Tao Chen, Wei-Kang Huang, Nohpill Park, Fred J. Meyer, Fabrizio Lombardi

Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 2001

2000

Testing and testable designs for one-time programmable FPGAs.

Tong Liu, Wei-Kang Huang, Fred J. Meyer, Fabrizio Lombardi

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2000

An Approach for Detecting Multiple Faulty FPGA Logic Blocks.

Wei-Kang Huang, Fred J. Meyer, Fabrizio Lombardi

IEEE Trans. Computers, 2000

Diagnosing the Interconnect of Bus-Connected Multi-RAM Systems under Restricted and General Fault Models.

Jun Zhao, Fred J. Meyer, Fabrizio Lombardi

Proceedings of the 8th IEEE International Workshop on Memory Technology, 2000

Complexity Bounds for Lookup Table Implementation of Factored Forms in FPGA Technology Mapping.

Wenyi Feng, Fred J. Meyer, Fabrizio Lombardi

Proceedings of the Parallel and Distributed Processing, 2000

1999

Test generation and scheduling for layout-based detection of bridge faults in interconnects.

Tong Liu, Xiao-Tao Chen, Fred J. Meyer, Fabrizio Lombardi

IEEE Trans. Very Large Scale Integr. Syst., 1999

Reconfiguring one-time programmable FPGAs.

Xiao-Tao Chen, Wenyi Feng, Jun Zhao, Fred J. Meyer, Fabrizio Lombardi

IEEE Micro, 1999

Adaptive Fault Detection and Diagnosis of RAM Interconnects.

Jun Zhao, Fred J. Meyer, Fabrizio Lombardi

J. Electron. Test., 1999

Guest Editors' Introduction: DRAM Architecture and Testing.

Bruce F. Cockburn, Fabrizio Lombardi, Fred J. Meyer

IEEE Des. Test Comput., 1999

Design Verification of FPGA Implementations.

Xiao-Tao Chen, Wei-Kang Huang, Nohpill Park, Fred J. Meyer, Fabrizio Lombardi

IEEE Des. Test Comput., 1999

Maximal Diagnosis of Interconnects of Random Access Memories.

Jun Zhao, Fred J. Meyer, Fabrizio Lombardi

Proceedings of the 17th IEEE VLSI Test Symposium (VTS '99), 1999

Interconnect Diagnosis of Bus-Connected Multi-RAM Systems.

Jun Zhao, Fred J. Meyer, Fabrizio Lombardi

Proceedings of the 7th IEEE International Workshop on Memory Technology, 1999

Two-Step Algorithms for Maximal Diagnosis of Wiring Interconnects.

Wenyi Feng, Fred J. Meyer, Fabrizio Lombardi

Proceedings of the Digest of Papers: FTCS-29, 1999

Good Processor Identification in Two-Dimensional Grids.

Fred J. Meyer, Fabrizio Lombardi, Jun Zhao

Proceedings of the 14th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '99), 1999

Novel Control Pattern Generators for Interconnect Testing with Boundary Scan.

Wenyi Feng, Fred J. Meyer, Fabrizio Lombardi

Proceedings of the 14th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '99), 1999

Reconfiguration of One-Time Programmable FPGAs with Faulty Logic Resources.

Wenyi Feng, Xiao-Tao Chen, Fred J. Meyer, Fabrizio Lombardi

Proceedings of the 14th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '99), 1999

A BIST TPG Approach for Interconnect Testing With the IEEE 1149.1 STD.

Wenyi Feng, Wei-Kang Huang, Fred J. Meyer, Fabrizio Lombardi

Proceedings of the 8th Asian Test Symposium (ATS '99), 1999

1998

Testing configurable LUT-based FPGA's.

Wei-Kang Huang, Fred J. Meyer, Xiao-Tao Chen, Fabrizio Lombardi

IEEE Trans. Very Large Scale Integr. Syst., 1998

Structural diagnosis of interconnects by coloring.

Xiao-Tao Chen, Fred J. Meyer, Fabrizio Lombardi

ACM Trans. Design Autom. Electr. Syst., 1998

Fault Detection and Diagnosis of Interconnects of Random Access Memories.

Jun Zhao, Fred J. Meyer, Fabrizio Lombardi

Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998

A New Method for Testing EEPLA's.

Avinash Munshi, Fred J. Meyer, Fabrizio Lombardi

Proceedings of the 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '98), 1998

On the Complexity of Sequential Testing in Configurable FPGAs.

Wenyi Feng, Fred J. Meyer, Wei-Kang Huang, Fabrizio Lombardi

Proceedings of the 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '98), 1998

Fault Detection in a Tristate System Environment.

Wenyi Feng, Wei-Kang Huang, Fred J. Meyer, Fabrizio Lombardi

Proceedings of the 7th Asian Test Symposium (ATS '98), 2-4 December 1998, Singapore, 1998

1997

On the Fault Coverage of Interconnect Diagnosis.

Xiao-Tao Chen, Fred J. Meyer, Fabrizio Lombardi

Proceedings of the 15th IEEE VLSI Test Symposium (VTS'97), 1997

Using Virtual Links for Reliable Information Retrieval Across Point-to-Point Networks.

Fred J. Meyer, Xiao-Tao Chen, Wei-Kang Huang, Fabrizio Lombardi

Proceedings of the Digest of Papers: FTCS-27, 1997

Multiple fault detection in logic resources of FPGAs.

Wei Liang Huang, Fred J. Meyer, Fabrizio Lombardi

Proceedings of the 1997 Workshop on Defect and Fault-Tolerance in VLSI Systems (DFT '97), 1997

Testing of programmable logic devices (PLD) with faulty resources.

David Ashen, Fred J. Meyer, Nohpill Park, Fabrizio Lombardi

Proceedings of the 1997 Workshop on Defect and Fault-Tolerance in VLSI Systems (DFT '97), 1997

A XOR-Tree Based Technique for Constant Testability of Configurable FPGAs.

Wei-Kang Huang, M. Y. Zhang, Fred J. Meyer, Fabrizio Lombardi

Proceedings of the 6th Asian Test Symposium (ATS '97), 17-18 November 1997, 1997

1993

Yield optimization of modular and redundant multimegabit RAMs: a study of effectiveness of coding versus static redundancy using the center-satellite model.

D. D. Sharma, Fred J. Meyer, Dhiraj K. Pradhan

IEEE Trans. Very Large Scale Integr. Syst., 1993

Communication structures in fault-tolerant distributed systems.

Dhiraj K. Pradhan, Fred J. Meyer

Networks, 1993

1991

Consensus With Dual Failure Modes.

Fred J. Meyer, Dhiraj K. Pradhan

IEEE Trans. Parallel Distributed Syst., 1991

1989

Modeling Defect Spatial Distribution.

Fred J. Meyer, Dhiraj K. Pradhan

IEEE Trans. Computers, 1989

Dynamic Testing Strategy for Distributed Systems.

Fred J. Meyer, Dhiraj K. Pradhan

IEEE Trans. Computers, 1989

1988

Flip-Trees: Fault-Tolerant Graphs with Wide Containers.

Fred J. Meyer, Dhiraj K. Pradhan

IEEE Trans. Computers, 1988