Junkyo Jeong

According to our database1, Junkyo Jeong authored at least 2 papers between 2024 and 2025.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

2025
Reliability Impacts of Tapered Nanosheets and Localized Layout Effects in MBCFETs Fabricated with 2NM Logic Technology Featuring GAA.
Proceedings of the IEEE International Reliability Physics Symposium, 2025

2024
Hot-Carrier-Degradation Characterization for Accurate End-of-Life Prediction with 3nm GAA Logic Technology Featuring Multi-Bridge-Channel FET.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024


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