Junru Qu
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Bibliography
2024
Low Temperature Characterization and Modeling of Hot Carrier Injection in 14 nm Si FinFET.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
Investigation of Read Disturb for Hf0.5Zr0.502 Ferroelectric Field-Effect Transistors Based Neuromorphic Applications.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
Hot Carrier Injection Induced Degradation of 14 nm FinFET under High Source-Drain Voltage Bias.
Proceedings of the IEEE International Conference on Integrated Circuits, 2024