Junru Qu

According to our database1, Junru Qu authored at least 3 papers in 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

2024
Low Temperature Characterization and Modeling of Hot Carrier Injection in 14 nm Si FinFET.
Proceedings of the IEEE International Reliability Physics Symposium, 2024

Investigation of Read Disturb for Hf0.5Zr0.502 Ferroelectric Field-Effect Transistors Based Neuromorphic Applications.
Proceedings of the IEEE International Reliability Physics Symposium, 2024

Hot Carrier Injection Induced Degradation of 14 nm FinFET under High Source-Drain Voltage Bias.
Proceedings of the IEEE International Conference on Integrated Circuits, 2024


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