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K. Daoud

According to our database1, K. Daoud authored at least 5 papers between 2010 and 2014.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of five.

Timeline

Legend:

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In proceedings 
Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

2014
Performance drifts of N-MOSFETs under pulsed RF life test.
[BibTeX]
[DOI]
Mohamed Ali Belaïd
,
M. Gares
,
K. Daoud
,
Olivier Latry
Microelectron. Reliab., 2014

Leakage current effects on N-MOSFETs after thermal ageing in pulsed life tests.
[BibTeX]
[DOI]
Mohamed Ali Belaïd
,
Ahmed M. Nahhas
,
M. Gares
,
K. Daoud
,
Olivier Latry
Microelectron. J., 2014

2012
Failure analysis of hot-electron effect on power RF N-LDMOS transistors.
[BibTeX]
[DOI]
Mohamed Ali Belaïd
,
M. Gares
,
K. Daoud
,
Philippe Eudeline
Proceedings of the 7th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2012

2011
S-parameter performance degradation in power RF N-LDMOS devices due to hot carrier effects.
[BibTeX]
[DOI]
Mohamed Ali Belaïd
,
M. Gares
,
K. Daoud
,
Philippe Eudeline
Microelectron. Reliab., 2011

2010
Evaluation of hot-electron effects on critical parameter drifts in power RF LDMOS transistors.
[BibTeX]
[DOI]
Mohamed Ali Belaïd
,
K. Daoud
Microelectron. Reliab., 2010


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