M. Gares

According to our database¹, M. Gares authored at least 10 papers between 2006 and 2014.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of five.

Timeline

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PhD thesis

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Bibliography

2014

Performance drifts of N-MOSFETs under pulsed RF life test.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2014

Leakage current effects on N-MOSFETs after thermal ageing in pulsed life tests.

[BibT_eX]

[DOI]

Microelectron. J., 2014

2012

Failure analysis of hot-electron effect on power RF N-LDMOS transistors.

[BibT_eX]

[DOI]

Proceedings of the 7th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2012

2011

S-parameter performance degradation in power RF N-LDMOS devices due to hot carrier effects.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2011

2007

Study of hot-carrier effects on power RF LDMOS device reliability.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2007

Comparative analysis of RF LDMOS capacitance reliability under accelerated ageing tests.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2007

Reliability study of power RF LDMOS device under thermal stress.

[BibT_eX]

[DOI]

Microelectron. J., 2007

2006

Hot carrier reliability of RF N- LDMOS for S Band radar application.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2006

Electrical parameters degradation of power RF LDMOS device after accelerated ageing tests.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2006

Impact de la Temperature sur la Fiabilite des Composants rf Ldmos de Puissance.

[BibT_eX]

[DOI]

Proceedings of the Canadian Conference on Electrical and Computer Engineering, 2006

M. Gares

Timeline

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On csauthors.net:

Bibliography

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