K. S. Tsai

According to our database1, K. S. Tsai
  • authored at least 1 paper in 1998.
  • has a "Dijkstra number"2 of five.

Timeline

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Links

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Bibliography

1998
Confidence analysis for defect-level estimation of VLSI random testing.
ACM Trans. Design Autom. Electr. Syst., 1998


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