Kathleen G. Purdy

According to our database, Kathleen G. Purdy authored at least 3 papers between 2002 and 2006.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2006

Combining Negative Binomial and Weibull Distributions for Yield and Reliability Prediction.

Thomas S. Barnett, Matt Grady, Kathleen G. Purdy, Adit D. Singh

IEEE Des. Test Comput., 2006

2002

Yield-Reliability Modeling: Experimental Verification and Application to Burn-In Reduction.

Thomas S. Barnett, Adit D. Singh, Matt Grady, Kathleen G. Purdy

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

Redundancy Implications for Early-Life Reliability: Experimental Verification of an Integrated Yield-Reliability Model.

Thomas S. Barnett, Matt Grady, Kathleen G. Purdy, Adit D. Singh

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002