Ke Li
Orcid: 0000-0003-3481-3272Affiliations:
- Jiangnan University, Wuxi, Jiangsu, China
According to our database1,
Ke Li
authored at least 11 papers
between 2017 and 2025.
Collaborative distances:
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Bibliography
2025
Semi-supervised dual-constraint centroid contrastive prototypical network for flip chip defect detection under limited labeled data.
Eng. Appl. Artif. Intell., 2025
2024
Search for a Dual-Convergence Sparse Feature Extractor With Visualization Vibration Signals Architecture Feature for Flip-Chip Defect Detection.
IEEE Trans. Ind. Informatics, August, 2024
Category-level selective dual-adversarial network using significance-augmented unsupervised domain adaptation for surface defect detection.
Expert Syst. Appl., March, 2024
Adv. Eng. Informatics, 2024
2023
A Novel Three-Probability Spaces Logic Decoupling Distillation for Flip-Chip Defect Detection.
IEEE Trans. Instrum. Meas., 2023
2021
Sparse Reconstruction for Microdefect Detection of Two-Dimensional Ultrasound Image Based on Blind Estimation.
IEEE Trans. Ind. Electron., 2021
2019
A novel fault diagnosis algorithm for rotating machinery based on a sparsity and neighborhood preserving deep extreme learning machine.
Neurocomputing, 2019
Simulation and Experimental Verification of Edge Blurring Phenomenon in Microdefect Inspection Based on High-Frequency Ultrasound.
IEEE Access, 2019
A New Rotation Machinery Fault Diagnosis Method Based on Deep Structure and Sparse Least Squares Support Vector Machine.
IEEE Access, 2019
2018
Microelectron. Reliab., 2018
2017
Sensors, 2017