Kewei Zuo

According to our database, Kewei Zuo authored at least 2 papers in 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2012

Methodology for analysis of TSV stress induced transistor variation and circuit performance.

Li Yu, Wen-Yao Chang, Kewei Zuo, Jean Wang, Douglas Yu, Duane S. Boning

Proceedings of the Thirteenth International Symposium on Quality Electronic Design, 2012

Test structure, circuits and extraction methods to determine the radius of infuence of STI and polysilicon pattern density.

Albert H. Chang, Kewei Zuo, Jean Wang, Douglas Yu, Duane S. Boning

Proceedings of the Thirteenth International Symposium on Quality Electronic Design, 2012