Kiyoshi Nikawa

According to our database1, Kiyoshi Nikawa authored at least 7 papers between 1997 and 2013.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of five.

Timeline

Legend:

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In proceedings 
Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

2013
Observation of impurity diffusion defect in IGBT using a laser terahertz emission microscope technique.
Microelectron. Reliab., 2013

2011
The combinational or selective usage of the laser SQUID microscope, the non-bias laser terahertz emission microscope, and fault simulations in non-electrical-contact fault localization.
Microelectron. Reliab., 2011

2009
Laser THz emission microscope as a novel tool for LSI failure analysis.
Microelectron. Reliab., 2009

New Approach of Laser-SQUID Microscopy to LSI Failure Analysis.
IEICE Trans. Electron., 2009

2004
How long can we succeed using the OBIRCH and its derivatives?
Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

1999
Failure Analysis Case Studies Using the IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) Method.
Proceedings of the 8th Asian Test Symposium (ATS '99), 1999

1997
New Capabilities of OBIRCH Method for Fault Localization and Defect Detection.
Proceedings of the 6th Asian Test Symposium (ATS '97), 17-18 November 1997, 1997


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