Kun-Ming Chen

According to our database, Kun-Ming Chen authored at least 10 papers between 2005 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2025

Improving Model Flexibility of Electrical Characteristic Prediction of a-IGZO-TFTs.

Khean Thye Bea, Jo-An Liao, Yen-Ting Chen, Hsin-Hui Hu, Yen-Lin Chen, Wai-Khuen Cheng, Kun-Ming Chen

Proceedings of the IEEE International Conference on Systems, Man, and Cybernetics, 2025

2023

Prediction of Electrical Characteristics of a-IGZO TFT Based on Transfer Learning-Based Variational Autoencoder.

Khean Thye Bea, Shih-Shin Hu, Wei-Hsuan Lin, Da Zheng Lin, Hsin-Hui Hu, Xiu-Zhi Chen, Ting-Ru Lin, Yen-Lin Chen, Kun-Ming Chen, Wai-Khuen Cheng

Proceedings of the IEEE International Conference on Systems, Man, and Cybernetics, 2023

The Electrical Properties of a-IGZO TFT Prediction Based on Variational Autoencoder Model.

Shih-Shin Hu, Kean-Thye Bea, Wei-Hsuan Lin, Da Zheng Lin, Xiu-Zhi Chen, Ting-Ru Lin, Hsin-Hui Hu, Yen-Lin Chen, Kun-Ming Chen, Wai-Khuen Cheng

Proceedings of the International Conference on Consumer Electronics - Taiwan, 2023

2022

Machine Learning-Based Approach to Analyze the Effect of Density of States on the Electrical Properties of a-IGZO TFT.

Xiu-Zhi Chen, Da Zheng Lin, Shih-Shin Hu, Hsin-Hui Hu, Yen-Lin Chen, Kun-Ming Chen

Proceedings of the IEEE International Conference on Consumer Electronics - Taiwan, 2022

2019

A simple extraction method for parasitic series resistances in GaN HEMTs considering non-quasi-static effects.

Venkatesan Nagarajan, Kun-Ming Chen, Huan-Chung Wang, Sankalp Kumar Singh, Deepak Anandan, Yueh-Chin Lin, Edward Yi Chang

Microelectron. J., 2019

2008

Electrical stress effect on RF power characteristics of SiGe hetero-junction bipolar transistors.

Sheng-Yi Huang, Kun-Ming Chen, Guo-Wei Huang, Cheng-Chou Hung, Wen-Shiang Liao, Chun-Yen Chang

Microelectron. Reliab., 2008

2005

RF MOSFET Characterization by Four-Port Measurement.

Shih-Dao Wu, Guo-Wei Huang, Kun-Ming Chen, Hua-Chou Tseng, Tsun-Lai Hsu, Chun-Yen Chang

IEICE Trans. Electron., 2005

A Cascade Open-Short-Thru (COST) De-Embedding Method for Microwave On-Wafer Characterization and Automatic Measurement.

Ming-Hsiang Cho, Guo-Wei Huang, Chia-Sung Chiu, Kun-Ming Chen, An-Sam Peng, Yu-Min Teng

IEICE Trans. Electron., 2005

Noise Parameters Computation of Microwave Devices Using Genetic Algorithms.

Han-Yu Chen, Guo-Wei Huang, Kun-Ming Chen, Chun-Yen Chang

IEICE Trans. Electron., 2005

A Novel Approach for Parameter Determination of HBT Small-Signal Equivalent Circuit.

Han-Yu Chen, Kun-Ming Chen, Guo-Wei Huang, Chun-Yen Chang

IEICE Trans. Electron., 2005