Leon Goumans

According to our database, Leon Goumans authored at least 1 paper in 2014.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of six.

2014

Copper wire interconnect reliability evaluation using in-situ High Temperature Storage Life (HTSL) tests.

Amar Mavinkurve, Leon Goumans, G. M. O'Halloran, Rene T. H. Rongen, Mark-Luke Farrugia

Microelectron. Reliab., 2014