Luis Alberto Rodríguez-Picón

According to our database, Luis Alberto Rodríguez-Picón authored at least 17 papers between 2016 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

A Systematic Review of Risk Management Methodologies for Complex Organizations in Industry 4.0 and 5.0.

Juan Vicente Barraza de la Paz, Luis Alberto Rodríguez-Picón, Victor Morales-Rocha, Soledad Vianey Torres-Argüelles

Syst., May, 2023

A reliability analysis for electronic devices under an extension of exponentiated perks distribution.

Luis Carlos Méndez González, Luis Alberto Rodríguez-Picón, Iván Juan Carlos Pérez Olguín, Vicente García, Abel Eduardo Quezada-Carreón

Qual. Reliab. Eng. Int., April, 2023

Emotional Classification Method (ECW): A Methodology for Measuring Emotional Sustainability in a Work Environment Utilizing Artificial Intelligence.

Florencio Abraham Roldán-Castellanos, Iván Juan Carlos Pérez Olguín, Aimeé Gutiérrez-Vázquez, Luis Carlos Méndez González, Luis Alberto Rodríguez-Picón

Axioms, February, 2023

An Additive Chen Distribution with Applications to Lifetime Data.

Luis Carlos Méndez González, Luis Alberto Rodríguez-Picón, Iván Juan Carlos Pérez Olguín, Luis Ricardo Vidal Portilla

Axioms, February, 2023

A Gamma Process with Three Sources of Variability.

Luis Alberto Rodríguez-Picón, Luis Carlos Méndez González, Iván Juan Carlos Pérez Olguín, Jesús Israel Hernández Hernández

Symmetry, 2023

2022

A Study of Stopping Rules in the Steepest Ascent Methodology for the Optimization of a Simulated Process.

Paulo Eduardo García-Nava, Luis Alberto Rodríguez-Picón, Luis Carlos Méndez González, Iván Juan Carlos Pérez Olguín

Axioms, 2022

2021

Suppliers selection based on intuitionistic fuzzy dimensional analysis.

Luis Asunción Pérez Dominguez, David Luviano Cruz, Luis Alberto Rodríguez-Picón, Roberto Romero-López, Karla Yohana Sánchez-Mojica

J. Intell. Fuzzy Syst., 2021

2020

Multi-objective optimization of an engine mount design by means of memetic genetic programming and a local exploration approach.

Alejandro Alvarado-Iniesta, Luis Gonzalo Guillen-Anaya, Luis Alberto Rodríguez-Picón, Raul Ñeco-Caberta

J. Intell. Manuf., 2020

2019

Reliability analysis using exponentiated Weibull distribution and inverse power law.

Luis Carlos Méndez González, Luis Alberto Rodríguez-Picón, Delia J. Valles-Rosales, Alejandro Alvarado-Iniesta, Abel Eduardo Quezada-Carreón

Qual. Reliab. Eng. Int., 2019

Using regression models for predicting the product quality in a tubing extrusion process.

Vicente García, J. Salvador Sánchez, Luis Alberto Rodríguez-Picón, Luis Carlos Méndez González, Humberto de Jesús Ochoa Domínguez

J. Intell. Manuf., 2019

A Deconvolution Approach for Degradation Modeling With Measurement Error.

Luis Alberto Rodríguez-Picón, Luis Asunción Pérez Dominguez, José Mejía, Iván Jc Pérez-Olguín, Manuel Iván Rodríguez-Borbón

IEEE Access, 2019

2018

Degradation modeling based on gamma process models with random effects.

Luis Alberto Rodríguez-Picón, Anna Patricia Rodríguez-Picón, Luis Carlos Méndez González, Manuel Iván Rodríguez-Borbón, Alejandro Alvarado-Iniesta

Commun. Stat. Simul. Comput., 2018

MOORA under Pythagorean Fuzzy Set for Multiple Criteria Decision Making.

Luis Asunción Pérez Dominguez, Luis Alberto Rodríguez-Picón, Alejandro Alvarado-Iniesta, David Luviano Cruz, Zeshui Xu

Complex., 2018

2017

Estimation of a log-linear model for the reliability assessment of products under two stress variables.

Luis Alberto Rodríguez-Picón, Víctor Hugo Flores-Ochoa

Int. J. Syst. Assur. Eng. Manag., 2017

Reliability Estimation for Accelerated Life Tests Based on a Cox Proportional Hazard Model with Error Effect.

Manuel Iván Rodríguez-Borbón, Manuel Arnoldo Rodríguez-Medina, Luis Alberto Rodríguez-Picón, Alejandro Alvarado-Iniesta, Naijun Sha

Qual. Reliab. Eng. Int., 2017

Reliability analysis for electronic devices using beta-Weibull distribution.

Luis Carlos Méndez González, Luis Alberto Rodríguez-Picón, Delia J. Valles-Rosales, Roberto Romero-López, Abel Eduardo Quezada-Carreón

Qual. Reliab. Eng. Int., 2017

2016

Reliability Estimation for Products Subjected to Two-Stage Degradation Tests Based on a Gamma Convolution.

Luis Alberto Rodríguez-Picón, Luis Carlos Méndez González, Manuel Iván Rodríguez-Borbón, Arturo Del Valle

Qual. Reliab. Eng. Int., 2016