Luis Carlos Méndez González

According to our database, Luis Carlos Méndez González authored at least 13 papers between 2016 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2023

A reliability analysis for electronic devices under an extension of exponentiated perks distribution.

Luis Carlos Méndez González, Luis Alberto Rodríguez-Picón, Iván Juan Carlos Pérez Olguín, Vicente García, Abel Eduardo Quezada-Carreón

Qual. Reliab. Eng. Int., April, 2023

Emotional Classification Method (ECW): A Methodology for Measuring Emotional Sustainability in a Work Environment Utilizing Artificial Intelligence.

Florencio Abraham Roldán-Castellanos, Iván Juan Carlos Pérez Olguín, Aimeé Gutiérrez-Vázquez, Luis Carlos Méndez González, Luis Alberto Rodríguez-Picón

Axioms, February, 2023

An Additive Chen Distribution with Applications to Lifetime Data.

Luis Carlos Méndez González, Luis Alberto Rodríguez-Picón, Iván Juan Carlos Pérez Olguín, Luis Ricardo Vidal Portilla

Axioms, February, 2023

A Gamma Process with Three Sources of Variability.

Luis Alberto Rodríguez-Picón, Luis Carlos Méndez González, Iván Juan Carlos Pérez Olguín, Jesús Israel Hernández Hernández

Symmetry, 2023

2022

A Study of Stopping Rules in the Steepest Ascent Methodology for the Optimization of a Simulated Process.

Paulo Eduardo García-Nava, Luis Alberto Rodríguez-Picón, Luis Carlos Méndez González, Iván Juan Carlos Pérez Olguín

Axioms, 2022

2021

Revisiting the Dissimilarity Representation in the Context of Regression.

Vicente García, J. Salvador Sánchez, Rafael Martínez-Peláez, Luis Carlos Méndez González

IEEE Access, 2021

2019

Reliability analysis using exponentiated Weibull distribution and inverse power law.

Luis Carlos Méndez González, Luis Alberto Rodríguez-Picón, Delia J. Valles-Rosales, Alejandro Alvarado-Iniesta, Abel Eduardo Quezada-Carreón

Qual. Reliab. Eng. Int., 2019

Using regression models for predicting the product quality in a tubing extrusion process.

Vicente García, J. Salvador Sánchez, Luis Alberto Rodríguez-Picón, Luis Carlos Méndez González, Humberto de Jesús Ochoa Domínguez

J. Intell. Manuf., 2019

2018

Degradation modeling based on gamma process models with random effects.

Luis Alberto Rodríguez-Picón, Anna Patricia Rodríguez-Picón, Luis Carlos Méndez González, Manuel Iván Rodríguez-Borbón, Alejandro Alvarado-Iniesta

Commun. Stat. Simul. Comput., 2018

2017

Reliability analysis for electronic devices using beta-Weibull distribution.

Luis Carlos Méndez González, Luis Alberto Rodríguez-Picón, Delia J. Valles-Rosales, Roberto Romero-López, Abel Eduardo Quezada-Carreón

Qual. Reliab. Eng. Int., 2017

2016

Reliability Estimation for Products Subjected to Two-Stage Degradation Tests Based on a Gamma Convolution.

Luis Alberto Rodríguez-Picón, Luis Carlos Méndez González, Manuel Iván Rodríguez-Borbón, Arturo Del Valle

Qual. Reliab. Eng. Int., 2016

Reliability Model for Electronic Devices under Time Varying Voltage.

Luis Carlos Méndez González, Manuel Iván Rodríguez-Borbón, Delia J. Valles-Rosales, Arturo Del Valle, Arnoldo Rodriguez

Qual. Reliab. Eng. Int., 2016

Reliability Analysis for Laptop Computer Under Electrical Harmonics.

Luis Carlos Méndez González, Manuel Iván Rodríguez-Borbón, Manuel R. Piña-Monarrez, Roberto Ambrosio, Arturo Del Valle

Qual. Reliab. Eng. Int., 2016