Luis Eduardo Seixas Jr.

According to our database, Luis Eduardo Seixas Jr. authored at least 2 papers between 2017 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2025

Exploring Fault Tolerance to Ionizing Radiation in Severe Environments: Power Transistors with Distinct Layouts.

Paulo R. Garcia, Guilherme I Grandesi, Alexis C. Vilas Bôas, Renato C. Giacomini, Nilberto H. Medina, Luis Eduardo Seixas Jr., Marcilei Aparecida Guazzelli

Proceedings of the 16th IEEE Latin America Symposium on Circuits and Systems, 2025

2017

VI-Based Measurement System Focusing on Space Applications.

Luis Eduardo Seixas Jr., Saulo Finco, Salvador Pinillos Gimenez

J. Electron. Test., 2017